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專利國別 |
美國 |
發表日期 |
2024-04-02 14:28:40 |
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專利讓與 |
一、依據國科會中華民國113年01月03日科部產字第1130001031號函辦理。 二、依據本校第380次智慧財產權審議委員會辦理。 三、公告日:2024年04月02日(星期二) 四、公告讓與期間:自公告日起3個月。 五、敬請有興趣辦理受讓之廠商,或對受讓申請程序有任何疑問者,聯繫研發處技術推廣中心洽談,電話:05-2720411轉16501、16505。 |
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本校案號 |
P103016A |
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專利名稱 |
反射式管狀波導粒子電漿共振感測系統及其感測裝置「REFLECTION-BASED TUBULAR WAVEGUIDE PARTICLE PLASMON REDONANCE SENSING SYSTEM AND SENSING DEVICE THEREOF」 |
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發明人 |
周禮君、黃昱中、陳建興、王之鐸、江昌嶽 |
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所屬院 |
理學院 |
提案單位 |
化學暨生物化學系所 |
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類型 |
發明 |
專利權人 |
國立中正大學 |
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申請號 |
14/806,321 |
申請日期 |
2015-07-22 |
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公開號 |
US 2016-0216205 A1 |
公開日期 |
2016-07-28 |
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證書號 |
US 9,612,197 B2 |
核准日期 |
2017-04-04 |
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國際分類號 |
G01N-021/552(2014.01) |
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專利權期間 |
2015.07.22~2035.07.22(延長13天至2035.08.04) |
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專利摘要 |
A reflection-based tubular waveguide particle plasmon resonance sensing system and a sensing device thereof are provided. The sensing device includes a hollow tubular waveguide element having wall, a reflection layer disposed on one end of the wall (distal end), and a noble metal nanoparticle layer distributed on the surface of the wall. An incident light enters the wall through another end of the tubular waveguide element (proximal end) and being total internal reflected many times along the wall, then is reflected by the reflection layer and being total internal reflected many times along the wall again, and finally, the incident light exits the proximal end. Wherein, when the sample contacts the noble metal nanoparticle layer of the tubular waveguide element, the particle plasmon resonance condition is altered and hence the signal intensity of the light exiting the tubular waveguide element changes. |
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圖示 |
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